ID:DA0261156X
ITC
I.T.C
Test Conference, International
Test Conference
同姓同名の著者を検索
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section]
International Test Conference c1999
: soft , : case , : microfiche
所蔵館7館
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
International Test Conference c1998
所蔵館8館
International Test Conference c1997
: soft , : case , :microfiche , :CD-ROM
所蔵館6館
International Test Conference c1996
所蔵館9館
International Test Conference c1995
edited by Paul H. Bardell ... [et al.]
IEEE Computer Society Press c1994
International Test Conference c1994
: soft , : case
所蔵館10館
International Test Conference c1993
所蔵館12館
[sponsored by the IEEE Computer Society Test Technology Techinical Committee and IEEE Philadelphia Section]
International Test Conference c1992
: soft. , : case. , : micro.
International Test Conference c1991
: library binding , : microfiche , : casebound
sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section
Tokyo : IEEE Computer Society Press c1990
: paper , : microfiche , : case
所蔵館4館
Sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section
IEEE Computer Society Press , Institute of Electrical and Electronics Engineers, c1989
所蔵館5館
sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section
Computer Society Press of the IEEE c1988
paper , microfiche , case
sponsored by the IEEE Computer Society, IEEE Philadelphia Section
Computer Society Press of the IEEE , Order from Computer Society of the IEEE c1987
pbk. , microfiche , case
所蔵館2館
sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section
IEEE Computer Society Press c1986
pbk. , microfiche , hard
所蔵館3館
IEEE Computer Society Press , Order from IEEE Computer Society 1985
pbk. , hard , microfiche
sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section
IEEE Computer Society Press c1984
所蔵館1館
IEEE Computer Society Press 1983
presented by the Test Technology Committee, the International Test Formation [i.e. Foundation] ; sponsored by IEEE Computer Society, IEEE Philadelphia Section
IEEE Computer Society Press c1982
sponsored by the IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE
Institute of Electrical and Electronics Engineers , order from IEEE Computer Society c1981
