International Conference on Ion Beam Surface Layer Analysis

ID:DA06278316

別名: Conference on Ion Beam Surface Layer Analysis, International

関連著者名: International Conference on Ion Beam Analysis

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1

Ion beam surface layer analysis

edited by O. Meyer, G. Linker, and F. Käppeler

Plenum Press c1976

v. 1 , v. 2

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2

Ion beam surface layer analysis : proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation

edited by James W. Mayer and James F. Ziegler

Elsevier Sequoia S.A. 1974

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