検索結果185件中 1-20 を表示

  • OSHIMA Masaharu ID: 9000000148896

    Technical Center, Nissan Motor Co. , Ltd. (1997年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Development of an on-board gradient data acquisition system (1997)
  • OSHIMA Masaharu ID: 9000003371754

    Department of Applied Chemistry, The University of Tokyo (2000年 CiNii収録論文より)

    CiNii収録論文: 7件

    • A Photoemission Study of Al and Au Overlayers on Se/GaAs(100) (1995)
    • Possibility of the Discrimination of Different Chemical States by Energy-Dispersive X-Ray Spectroscopy (1998)
    • In-Advance Simulation and Chemical State Analysis by Spectro-Diffractometry (1998)
  • OSHIMA Masaharu ID: 9000005752509

    The Electrical Communication Laboratories, Nippon Telegraph and Telephone Public Corporation (1980年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Quantitative Analysis of Semiconductor Materials with Secondary Ion Mass Spectrometer : B-5: COMPOUND SEMICONDUCTOR DEVICE TECHNOLOGY (1980)
  • Oshima Masaharu ID: 9000019261877

    CiNii収録論文: 1件

    • Erratum: "Antiferromagnetic Domain Structure Imaging of Cleaved NiO(100) Surface Using Nonmagnetic Linear Dichroism at O K edge: Essential Effect of Antiferromagnetic Crystal Distortion" (2005)
  • Oshima Masaharu ID: 9000019281337

    CiNii収録論文: 1件

    • Epitaxial Growth of InAs on Single-Crystalline Mn–Zn Ferrite Substrates (1999)
  • Oshima Masaharu ID: 9000019281410

    CiNii収録論文: 1件

    • New Self-Organized Growth Method for InGaAs Quantum Dots on GaAs(001) Using Droplet Epitaxy (1999)
  • Oshima Masaharu ID: 9000019283162

    Department of Applied Chemistry, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan (2013年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Band Configuration of SiO2/m-Plane ZnO Heterointerface Correlated with Electrical Properties of Al/SiO2/ZnO Structures (2013)
  • Oshima Masaharu ID: 9000019289359

    CiNii収録論文: 1件

    • GaN Heteroepitaxial Growth on LiTaO3(0001) Step Substrates by Pulsed Laser Deposition (2005)
  • Oshima Masaharu ID: 9000019314821

    CiNii収録論文: 1件

    • Surface Structure of InAs (001) Treated with (NH4)2Sx Solution (1991)
  • Oshima Masaharu ID: 9000019321212

    CiNii収録論文: 1件

    • Temperature-Dependent Soft X-ray Photoemission and Absorption Studies of Charge Disproportionation in La1-xSrxFeO3 (2006)
  • Oshima Masaharu ID: 9000019326538

    CiNii収録論文: 1件

    • Effect of Impurity at SiO2/Si Interface on 2D Hole Gas (2000)
  • Oshima Masaharu ID: 9000019332842

    CiNii収録論文: 1件

    • Photoemission Study on Initial Oxidation of Si Surfaces by Super-Pure Oxygen Gas (1991)
  • Oshima Masaharu ID: 9000019338486

    CiNii収録論文: 1件

    • Characteristics of Thick $m$-Plane InGaN Films Grown on ZnO Substrates Using Room Temperature Epitaxial Buffer Layers (2010)
  • Oshima Masaharu ID: 9000019353473

    CiNii収録論文: 1件

    • Use of Mass Spectra for End Point Detection in Etching SiO2 Films on Si (1981)
  • Oshima Masaharu ID: 9000019360687

    CiNii収録論文: 1件

    • An Investigation of the Properties of an Epitaxial Si Layer on a Substrate with a Buried SiO2 Layer Formed by Oxygen-Ion Implantation (1982)
  • Oshima Masaharu ID: 9000019360999

    CiNii収録論文: 1件

    • Systematic Analysis of ARPES Spectra of Transition-Metal Oxides: Nature of Effective $d$ Band (2009)
  • Oshima Masaharu ID: 9000019362073

    CiNii収録論文: 1件

    • Electronic Structure of the Novel Filled Skutterudite PrPt4Ge12 Superconductor (2010)
  • Masaharu Oshima ID: 9000019367990

    Department of Applied Chemistry, The University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo 113-8656, Japan (2010年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Metalorganic Chemical Vapor Deposition of Al2O3 Thin Films from Dimethylaluminumhydride and O2 (2010)
  • Masaharu Oshima ID: 9000019369892

    Department of Applied Chemistry, The University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo 113-8656, Japan (2010年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Carrier Compensation by Excess Oxygen Atoms in Anatase Ti0.94Nb0.06O2+δ Epitaxial Thin Films (2010)
  • Oshima Masaharu ID: 9000019380309

    CiNii収録論文: 1件

    • Antiferromagnetic Domain Structure Imaging of Cleaved NiO(100) Surface Using Nonmagnetic Linear Dichroism at O K Edge: Essential Effect of Antiferromagnetic Crystal Distortion (2004)
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