検索結果19件中 1-19 を表示

  • WANG Junli ID: 9000002106373

    Hefei National Laboratory for Physical Sciences at Microscale & Department of Chemistry, University of Science and Technology of China (2008年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Benzene-thermal Route to InP and InAs Nanocrystals Using Triphenylphosphine and Triphenylarsine as Pnicogen Sources (2008)
  • WANG Junli ID: 9000002304952

    Advanced Science and Technology Center for Cooperative Research,Kyushu Univ. (2001年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Formation of Ultra-thin Si Oxide for High-k Gate Dielectrics Interface Engineering Using Electron Cyclotron Resonance (ECR) Plasmas Oxidation (2001)
  • WANG Junli ID: 9000002304985

    Venture Business Laboratory,Kyushu Univ. (2002年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Structural and electrical properties of Zr oxide film for high-κ gate dielectrics by using electron cyclotron resonance plasma sputtering (2002)
  • Wang Junli ID: 9000019286273

    CiNii収録論文: 1件

    • Effect of Ion Mass and Ion Energy on Low-Temperature Deposition of Polycrystalline-Si Thin Film on SiO2 Layer by Using Sputtering-Type Electron Cyclotron Resonance Plasma (2003)
  • Wang Junli ID: 9000019324633

    CiNii収録論文: 1件

    • Optimum Discharge Condition of DC Bias Electron Cyclotron Resonance Plasma Sputtering for High Quality Si Epitaxial Growth (2000)
  • Wang Junli ID: 9000019358446

    CiNii収録論文: 1件

    • Growth of Epitaxial Silicon Film at Low Temperature by Using Sputtering-Type Electron Cyclotron Resonance Plasma (1999)
  • Wang Junli ID: 9000019369240

    CiNii収録論文: 1件

    • Growth Kinetics and Electrical Properties of Ultrathin Si Oxide Film Fabricated Using Krypton-Diluted Oxygen Plasma Excited by Electron Cyclotron Resonance (2003)
  • Wang Junli ID: 9000019432339

    Semiconductor Technology Development Division, Semiconductor Business Group, Sony Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa 243-0014, Japan (2008年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Tinv Scaling and Gate Leakage Reduction for n-Type Metal Oxide Semiconductor Field Effect Transistor with HfSix/HfO2 Gate Stack by Interfacial Layer Formation Using Ozone–Water-Last Treatment (2008)
  • Wang Junli ID: 9000019540002

    CiNii収録論文: 1件

    • Effect of Substrate Bias on Si Epitaxial Growth Using Sputtering-Type Electron Cyclotron Resonance (ECR) Plasma (1999)
  • Wang Junli ID: 9000019587599

    CiNii収録論文: 1件

    • Room Temperature Deposition of Silicon Nitride Films for Passivation of Organic Electroluminescence Device Using a Sputtering-Type Electron Cyclotron Resonance Plasma (1999)
  • Wang Junli ID: 9000019597743

    Art, Science and Technology Center for Cooperative Research, Kyushu University, Kasuga, Fukuoka 816-8580, Japan (2004年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Method for Detecting Defects in Silicon-On-Insulator Using Capacitance Transient Spectroscopy (2004)
  • WANG Junli ID: 9000021468754

    Traffic Management Engineering Department Chinese People's Public Security University (2005年 CiNii収録論文より)

    CiNii収録論文: 1件

    • RESEARCH ON URBAN TRAFFIC INTELLIGENT CONTROL INTEGRATED SYSTEM (2005)
  • WANG Junli ID: 9000257793557

    School of Chemistry and Environmental Science, Key Laboratory for Environmental Pollution Control Technology of Henan Province, Henan Normal University (2007年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Binding of Human Serum Albumin to N-(p-Ethoxy-phenyl)-N'-(1-naphthyl)thiourea and Synchronous Fluorescence Determination of Human Serum Albumin (2007)
  • Wang Junli ID: 9000258144147

    Interdisciplinary Graduate School of Engineering Sciences, Kyushu University, Kasuga, Fukuoka 816–8580, Japan (1999年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Effect of Substrate Bias on Si Epitaxial Growth Using Sputtering-Type Electron Cyclotron Resonance(ECR) Plasma. (1999)
  • Wang Junli ID: 9000258148459

    Interdisciplinary Graduate School of Engineering Sciences, Kyushu University, Kasuga Fukuoka 816–8580, Japan (1999年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Room Temperature Deposition of Silicon Nitride Films for Passivation of Organic Electroluminescence Device Using a Sputtering-Type Electron Cyclotron Resonance Plasma. (1999)
  • Wang Junli ID: 9000258172427

    Art, Science and Technology Center for Cooperative Research, Kyushu University (2004年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Method for Detecting Defects in Silicon-On-Insulator Using Capacitance Transient Spectroscopy (2004)
  • Wang Junli ID: 9000283621129

    College of Life and Environmental Sciences, Central University for Nationalities (2007年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Genetic Transformation of Eucommia ulmoides Oliv. with the Late Embryogenesis Abundant Protein Gene (2007)
  • Wang Junli ID: 9000010332272

    CiNii収録論文: 1件

    • Binding of human serum albumin to N-(p-ethoxy-phenyl)-N'-(1-naphthyl)thiourea and synchronous fluorescence determination of human serum albumin (2007)
  • 王 俊利 ID: 9000004746640

    九州大学先端科学技術共同研究センター (2003年 CiNii収録論文より)

    CiNii収録論文: 4件

    • ECRプラズマを活用した高品質絶縁膜の低温形成 (2003)
    • ECRプラズマを活用した高品質絶縁膜の低温形成 (2003)
    • ECRプラズマを活用した高品質絶縁膜の低温形成 (2003)
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