Search Results:　 1-20 of 4589

Lin Jing-Chie , Wu Jing-Nan , Tseng Chun-An , Peng Kun-Cheng

… Through examination by atomic force microscopy (AFM), the films revealed their average surface roughness (R_{\text{a}}) decreased from 10.74 to 5.40 nm with increasing the Ti-content. …

Jpn J Appl Phys 52(1), 01AC06-01AC06-6, 2013-01-25

The Japan Society of Applied Physics

Yamashita Hayato , Inoue Keiichi , Shibata Mikihiro , Uchihashi Takayuki , Sasaki Jun , Kandori Hideki , Ando Toshio

… Here, we study this issue by comparing properties of assembled and non-assembled bR trimers using directed mutagenesis, high-speed atomic force microscopy (HS-AFM), optical spectroscopy, and a proton pumping assay. … HS-AFM imaging reveals that both crystallized D96N and non-crystallized D96N/W12I mutants undergo a large conformational change (i.e., outward E-F loop displacement) upon light-activation. …

Journal of Structural Biology xx(xx), xxxx-xxxx, 2013-00-00

IR CrossRef

Hong Liu , Tanaka Hirofumi , Ogawa Takuji

… Large rectification appeared in the current--voltage (I--V) curves of C3-NDI molecules on an SWNT measured by point-contact current imaging atomic force microscopy (PCI-AFM). … It is considered that a Schottky barrier is formed at the SWNT junction, while additional rectification is induced by polarization between an AFM cantilever and C3-NDI. …

Applied Physics Express 5(11), 115102-115102-3, 2012-11-25

The Japan Society of Applied Physics

Imura Tomohiro , Kawamura Daisuke , Ishibashi Yuko [他]

Journal of Oleo Science 61(11), 659-664, 2012-11-00

Kaneta Akio , Kim Yoon-Seok , Funato Mitsuru , Kawakami Yoichi , Enya Yohei , Kyono Takashi , Ueno Masaki , Nakamura Takao

… Furthermore, atomic force microscopy (AFM) reveals ridge structures along the [\bar{1}2\bar{1}0] direction. … Superimposing the SNOM-PL image with an AFM image, we find a clear correlation between the spatial distributions of PL peak wavelength and surface morphology. …

Applied Physics Express 5(10), 102104-102104-3, 2012-10-25

The Japan Society of Applied Physics

Chang Chia-Feng , Chiang Yi-Fang , Chen Jiann-Ruey

… We have proved that the synthesized graphenes successfully based on transmission electron microscopy (TEM), atomic force microscopy (AFM), X-ray powder diffraction (XRD), Raman spectroscopy (Raman), and Fourier transform infrared (FTIR) analysis. …

Jpn J Appl Phys 51(10), 105102-105102-5, 2012-10-25

The Japan Society of Applied Physics

Mizuochi Norikazu , Tokuda Norio , Ogura Masahiko , Yamasaki Satoshi

… Using atomic force microscopy (AFM) measurements, suppression of the density of surface islands and enlargement of the step-free surface area were identified. …

Jpn J Appl Phys 51(9), 090106-090106-5, 2012-09-25

The Japan Society of Applied Physics

Kim Chang Hoi , Kim Hong Seung , Lee Jong Hoon , Pin Min Wook , Park Mi Seon , Lee Won Jae , Jang Nak Won , Yun Young

… The effects of the stacked buffer layer thickness on the structural and optical properties were investigated by X-ray diffraction (XRD), atomic force microscopy (AFM), energy dispersive X-ray (EDX), and UV--visible spectroscopy. …

Jpn J Appl Phys 51(9), 09MF06-09MF06-4, 2012-09-25

The Japan Society of Applied Physics

Kim Jin Woong , Osumi Tsuyoshi , Mastuoka Masashi , Tai Takeshi , Nishide Masamichi , Funakubo Hiroshi , Shima Hiromi , Nishida Ken , Yamamoto Takashi

… Atomic force microscopy (AFM) study proved that BZT films possess a dense microstructure without cracks or voids. …

Jpn J Appl Phys 51(9), 09LA01-09LA01-5, 2012-09-25

The Japan Society of Applied Physics

Lim Seung-Kyu , Park Eun-Mi , Kim Jin-Soo , Na Seong-Hoon , Park Ho-Jun , Oh Yong-Soo , Suh Su-Jeong

… The surface morphology was observed by field emission scanning electron microscopy (FE-SEM) and atomic force microscopy (AFM). …

Jpn J Appl Phys 51(9), 096501-096501-4, 2012-09-25

The Japan Society of Applied Physics