Search Results 1-20 of 7140

  • Effects of (Bi

    Choi Jin , Yoshimura Takeshi , Fujimura Norifumi

    … The BF–BNT film piezoelectric coefficient (d<inf>33(AFM)</inf>) of the BF–BNT film deposited at 450 °C is ∼100 pm/V, which is comparable to the best value of BF-based films with substitutions of other perovskite or rare-earth elements. …

    Jpn. J. Appl. Phys. 55(10S), 10TA17, 2016-09-21


  • Growth of epitaxial tetragonal (Bi,K)TiO

    Nemoto Yuichi , Ichinose Daichi , Shimizu Takao , Uchida Hiroshi , Yamaoka Wakiko , Sato Yusuke , Funakubo Hiroshi

    … These heat-treated (Bi,K)TiO<inf>3</inf>films showed piezoelectricity with an apparent piezoelectric coefficient (d<inf>33(AFM)</inf>) of 22 pm/V. …

    Jpn. J. Appl. Phys. 55(10S), 10TA13, 2016-09-16


  • Advanced in situ multi-scale characterization of hardness of carbon-fiber-reinforced plastic

    Wang Hongxin , Masuda Hideki , Kitazawa Hideaki , Onishi Keiko , Kawai Masamichi , Fujita Daisuke

    … In situ multi-scale characterization of hardness of carbon-fiber-reinforced plastic (CFRP) is demonstrated by a traditional hardness tester, instrumented indentation tester and atomic-force-microscope (AFM)-based nanoindentation. … The Vickers hardnesses of the carbon fiber and plastic matrix determined by AFM-based nanoindentation were 340 ± …

    Jpn. J. Appl. Phys. 55(10), 106602, 2016-09-09


  • Characterization of nanocarbon deposited on insulator substrate by alcohol chemical vapor deposition

    Tsujimoto Marina , Murata Hidenobu , Tachibana Masaru

    … According to atomic force microscopy (AFM) observation, the height of the sheetlike grains is below 1 nm, which is comparable to that of single-layer graphene, while the hills have a height of several nm. …

    Jpn. J. Appl. Phys. 55(10), 105101, 2016-08-31


  • Removal of excess polymer from a suspension containing hybrids of thermoresponsive polymer and carbon nanotubes using aggregation phenomenon

    Izumi Katsuki , Kumashiro Yoshikazu , Oura Shusuke , Okano Teruo , Umemura Kazuo

    … Results of UV–vis spectroscopy and atomic force microscopy (AFM) suggest that the PNIPAAm–SWNT hybrids retained their hybridized structures even after the treatment process. …

    Jpn. J. Appl. Phys. 55(9), 095003, 2016-08-18


  • Friction Measurements of Scales on Firebrats Body Surfaces by Using AFM  [in Japanese]

    奥田 直人 , 平井 悠司 , 下村 政嗣

    表面科学 = Journal of the Surface Science Society of Japan 37(8), 369-373, 2016-08

  • Instrumentation of SNOM/AFM and Nanoscale Imaging of Bio-samples  [in Japanese]

    村松 宏

    薄膜・表面物理セミナー 44, 1-7, 2016-07-29

  • Quantum Phase Transitions and Multicriticality in Ta(Fe<sub>1−</sub><italic><sub>x</sub></italic>V<italic><sub>x</sub></italic>)<sub>2</sub>

    Brando Manuel , Kerkau Alexander , Todorova Adriana , Yamada Yoshihiro , Khuntia Panchanan , Förster Tobias , Burkhard Ulrich , Baenitz Michael , Kreiner Guido

    … Our results indicate that on approaching TaFe<sub>2</sub>from the vanadium-rich side, ferromagnetic (FM) correlations increase faster than the antiferromagnetic (AFM) ones. … At <italic>x</italic>= 0.02 both FM and AFM energy scales have similar strength and the system remains paramagnetic down to 2 K with an extremely large Stoner enhancement factor of about 400. …

    Journal of the Physical Society of Japan 85(8), 084707-1-8, 2016-07-25


  • Comparison between power-law rheological parameters of living cells in frequency and time domains measured by atomic force microscopy

    Takahashi Ryosuke , Okajima Takaharu

    … We investigated how stress relaxation mapping is quantified compared with the force modulation mapping of confluent epithelial cells using atomic force microscopy (AFM). … Using a multi-frequency AFM technique, we estimated the power-law rheological behaviors of cells simultaneously in time and frequency domains. …

    Jpn. J. Appl. Phys. 55(8S1), 08NB22, 2016-07-22


  • Dimensional comparison between amplitude-modulation atomic force microscopy and scanning ion conductance microscopy of biological samples

    Kim Joonhui , Choi MyungHoon , Jung Goo-Eun , Ferhan Abdul , Cho Nam-Joon , Cho Sang-Joon

    … The range of scanning probe microscopy (SPM) applications for atomic force microscopy (AFM) is expanding in the biological sciences field, reflecting an increasing demand for tools that can improve our fundamental understanding of the physics behind biological systems. …

    Jpn. J. Appl. Phys. 55(8S1), 08NB18, 2016-07-15


  • Observation of adsorption behavior of biomolecules on ferroelectric crystal surfaces with polarization domain patterns

    Nakayama Tomoaki , Isobe Akiko , Ogino Toshio

    … We observed the polarization-dependent adsorption of avidin molecules, which are positively charged in a buffer solution at pH 7.0, on LiTaO<inf>3</inf>surfaces caused by electrostatic interaction at an electrostatic double layer using atomic force microscopy (AFM). … Avidin adsorption in the buffer solution was confirmed by scratching the substrate surfaces using the AFM cantilever, and the adsorption patterns were found to depend on the avidin concentration. …

    Jpn. J. Appl. Phys. 55(8S1), 08NB17, 2016-07-15


  • Effect of N

    Suzuki Yohei , Kusakabe Yasuhiro , Uchiyama Shota , Maruyama Takahiro , Naritsuka Shigeya , Shimizu Kazuo

    … Atomic force microscopy (AFM) measurement shows that the microplasma treatment is also effective for undoing the surface double steps through etching, which is helpful for a very smooth layer-by-layer growth in the early stage of growth. …

    Jpn. J. Appl. Phys. 55(8), 081002, 2016-07-13


  • Static and Dynamic Magnetic Response of Fragmented Haldane-like Spin Chains in Layered Li<sub>3</sub>Cu<sub>2</sub>SbO<sub>6</sub>

    Koo Changhyun , Zvereva Elena A. , Shukaev Igor L. , Richter Michael , Stratan Mikhail I. , Vasiliev Alexander N. , Nalbandyan Vladimir B. , Klingeler Rüdiger

    … The data suggest ferromagnetic–antiferromagnetic alternating chains with <italic>J</italic><sub>FM</sub>= −285 K and <italic>J</italic><sub>AFM</sub>= 160 K with a significant amount of Li-defects in the chains. … The results are discussed in the scenario of fragmented 1D <italic>S</italic>= 1 AFM chains with a rather high defect concentration of about 17% and associated <italic>S</italic>= 1/2 edge states of the resulting finite Haldane chains. …

    Journal of the Physical Society of Japan 85(8), 084702-1-7, 2016-07-11


  • Novel Interplay between High-<italic>T</italic><sub>c</sub>Superconductivity and Antiferromagnetism in Tl-Based Six-CuO<sub>2</sub>-Layered Cuprates: <sup>205</sup>Tl- and <sup>63</sup>Cu-NMR Probes

    Mukuda Hidekazu , Shiki Nozomu , Kimoto Naoki , Yashima Mitsuharu , Kitaoka Yoshio , Tokiwa Kazuyasu , Iyo Akira

    … We report <sup>63</sup>Cu- and <sup>205</sup>Tl-NMR studies on six-layered (<italic>n</italic>= 6) high-<italic>T</italic><sub>c</sub>superconducting (SC) cuprate TlBa<sub>2</sub>Ca<sub>5</sub>Cu<sub>6</sub>O<sub>14+δ</sub>(Tl1256) with <italic>T</italic><sub>c</sub>∼ 100 K, which reveal that antiferromagnetic (AFM) order takes place below <italic>T</italic><sub>N</sub>∼ 170 K. …

    Journal of the Physical Society of Japan 85(8), 083701-1-4, 2016-07-11


  • Investigation of the depletion layer by scanning capacitance force microscopy with Kelvin probe force microscopy

    Uruma Takeshi , Satoh Nobuo , Yamamoto Hidekazu

    … We have developed a scanning probe microscope (SPM) that combines atomic force microscopy (AFM) with both Kelvin probe force microscopy (KFM — … The surface physical characteristics of a commercial Si Schottky barrier diode (Si-SBD), with and without an applied reverse bias, were measured over the same area by our AFM/KFM/SCFM system. …

    Jpn. J. Appl. Phys. 55(8S1), 08NB10, 2016-07-08


  • Atomic force microscopy surface analysis of layered perovskite La

    Orum Aslihan , Takatori Kazumasa , Hori Shigeo , Ikeda Tomiko , Yoshimura Masamichi , Tani Toshihiko

    … The atomic force microscopy (AFM) observations revealed that the developed plane of the platelike particles is along the interlayers in the {110}-type layered crystal structure, and is considered to represent the lowest surface energy plane in which strong, periodic Ti–O bond chains terminate. … AFM measurements suggest that the prism facets are {210}-La<inf>2</inf>Ti<inf>2</inf>O<inf>7</inf>, which results in lower interfacial energy within KCl. …

    Jpn. J. Appl. Phys. 55(8S1), 08NB08, 2016-07-08


  • Surface nanobubbles studied by atomic force microscopy techniques: Facts, fiction, and open questions

    Schönherr Holger , Hain Nicole , Walczyk Wiktoria , Wesner Daniel , Druzhinin Sergey

    … The most prominent technique used thus far has been atomic force microscopy (AFM). … However, due to its potentially invasive nature, AFM data must be interpreted with great care. … Despite recent explanations of both the stability and the unusual nanoscopic contact angles, the development of new co-localization approaches and the adequate analysis of AFM data of surface nanobubbles are important as a means to confirm the gaseous nature and correctly estimate the interfacial curvature. …

    Jpn. J. Appl. Phys. 55(8S1), 08NA01, 2016-07-08


  • Optical and mechanical detection of near-field light by atomic force microscopy using a piezoelectric cantilever

    Satoh Nobuo , Kobayashi Kei , Watanabe Shunji , Fujii Toru , Matsushige Kazumi , Yamada Hirofumi

    … In this study, we developed an atomic force microscopy (AFM) system with scanning near-field optical microscopy (SNOM) using a microfabricated force-sensing cantilever with a lead zirconate titanate (PZT) thin film. …

    Jpn. J. Appl. Phys. 55(8S1), 08NB04, 2016-07-01


  • Elastic and viscoelastic characterization of inhomogeneous polymers by bimodal atomic force microscopy

    Nguyen Hung , Ito Makiko , Nakajima Ken

    … The elastic and viscoelastic responses of inhomogeneous polymers upon interacting with an atomic force microscopy (AFM) probe are simultaneously characterized by a bimodal AFM approach namely the amplitude- and frequency-modulation (AM–FM) method. … In this approach, the AFM probe is operated in the AM mode at the first flexural frequency and in the FM mode at a higher flexural frequency. …

    Jpn. J. Appl. Phys. 55(8S1), 08NB06, 2016-07-01


  • Combined atomic force microscopy and voltage pulse technique to accurately measure electrostatic force

    Inami Eiichi , Sugimoto Yoshiaki

    … The technique is based on frequency modulation atomic force microscopy (FM-AFM) combined with a voltage pulse. … This allows us to directly extract capacitive forces including the longer range part, to which the conventional FM-AFM is insensitive. …

    Jpn. J. Appl. Phys. 55(8S1), 08NB05, 2016-07-01


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