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Structure Analysis of Fluoride Crystal on GaAs by High-Resolution X-ray Diffractometry
[in Japanese]
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Masaki Hirokazu
,
Maeda Kouji
,
Sakai Kentaro
,
Ozeki Masashi
,
Suzuki Hidetoshi
… The lattice constants of <001> … direction of the films were determined by rocking curve measurement, the (004) and (224) reciprocal lattice maps by the high resolution X-ray diffractometry. … The lattice constants of both directions increased as the SrF_2 composition increasing. … The lattice constant of the films which was expected for the 0.1% lattice mismatched could be measured. …
Memoirs of the Faculty of Engineering, Miyazaki University 41, 155-159, 2012-07-30
IR