Search Results:　 1-20 of 945

Hiramatsu Mineo , Naito Masateru , Kondo Hiroki , Hori Masaru

… The plasma ball produced in the resonant cavity provides a number of important species as well as ions, while deposits are damaged by the excess ion bombardment since the substrate is exposed to the plasma ball. … To simply control the position of the plasma ball and reduce the ion bombardment on the substrate surface, a grounded molybdenum mesh was installed over the substrate plate to realize a remote plasma configuration. …

Jpn J Appl Phys 52(1), 01AK04-01AK04-5, 2013-01-25

The Japan Society of Applied Physics

Shueh Chin , Chen Pei-Shi , Cortie David , Klose Frank , Chen Wen-Chen , Wu Te-Ho , Lierop Johan van , Lin Ko-Wei

… The CoFe-oxide surface structure was varied systematically by low energy (0--70 V) Argon ion-beam bombardment before subsequent deposition of the Co90Fe10 layer. …

Jpn J Appl Phys 51(11), 11PG02-11PG02-4, 2012-11-25

The Japan Society of Applied Physics

Johnson Erik V. , Pouliquen Sylvain , Delattre Pierre-Alexandre , Booth Jean-Paul

… The use of tailored voltage waveforms (TVW's) to excite a plasma for the deposition of thin films of hydrogenated microcrystalline silicon (μc-Si:H) has been shown to be an effective technique to decouple mean ion bombardment energy (IBE) from injected power. …

Jpn J Appl Phys 51(8), 08HF01-08HF01-5, 2012-08-25

The Japan Society of Applied Physics

Yoshimura Satoru , Hine Kiyohiro , Kiuchi Masato , Hashimoto Jun , Terauchi Masaharu , Honda Yosuke , Nishitani Mikihiko , Hamaguchi Satoshi

… In this work, sputtering yields of CaO, SrO, and BaO by monochromatic He+, Ar+, or Kr+ ion beams of normal incidence have been obtained experimentally at relatively low incident energies by a mass-selected ion beam system. …

Jpn J Appl Phys 51(8), 08HB02-08HB02-4, 2012-08-25

The Japan Society of Applied Physics

Lee Keon Hwa , Kang Ki Man , Hong Gi Cheol , Kim Seung Hwan , Sun Woo Young , Yang Gye Mo

… In this study we investigate an InGaN layer damaged by the bombardment of energetic oxygen ions that is placed beneath a p-electrode to act as a current blocking layer (CBL). …

Jpn J Appl Phys 51(8), 082102-082102-4, 2012-08-25

The Japan Society of Applied Physics

KOHRI Ami , HAYASHIDA Fumihiko , SHINOHARA Yoshiaki , MATSUMURA Yoshihito

日本金屬學會誌 76(5), 355-358, 2012-05-01

References (23)

Kim Yun Young , Alwi Hasan Adli , Awang Rozidawati , Krishnaswamy Sridhar

… Results show a trend of increase in \alpha as the deposition time increases due to the microstructural changes associated with longer exposure to ion bombardment effects on the growth surface of the films. …

Jpn J Appl Phys 50(12), 125602-125602-6, 2011-12-25

The Japan Society of Applied Physics

ASAKAWA Daiki , HIRAOKA Kenzo

… Electrospray droplet impact (EDI) secondary ion mass spectrometry (SIMS) is a desorption/ionization technique for mass spectrometry. … In addition, EDI produces a much smaller number of hydrogen atoms compared with matrix-assisted laser desorption/ionization (MALDI) and fast atom bombardment (FAB). …

Journal of the Mass Spectrometry Society of Japan 59(5), 95-105, 2011-10-01

J-STAGE CrossRef References (58)

YAMAKI Tetsuya

… The bombardment of heavy ions accelerated to MeV or higher energies produces a continuous trail of excited and ionized molecules in polymers, which is known as a latent track. … The approach using this ion-track technology is based on the chemical etching and/or modification of each track with diameters of tens to hundreds of nanometers. …

MEMBRANE 36(5), 240-247, 2011-09-01

J-STAGE CrossRef References (36)