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Accurate Thickness Measurement of Two Adjacent Sheet Structures in CT Images(<Special Section>Advanced Image Technology)
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CHENG Yuanzhi
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SATO Yoshinobu
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TANAKA Hisashi
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NISHII Takashi
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SUGANO Nobuhiko
,
NAKAMURA Hironobu
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YOSHIKAWA Hideki
,
WANG Shuguo
,
TAMURA Shinichi
… The difference between the predicted and the actual gray-level profiles observed in the CT data is minimized by refining the model parameters. … Both a one-by-one search (exhaustive combination search) technique and a nonlinear optimization technique based on the Levenberg-Marquardt algorithm are used to minimize the difference. …
IEICE transactions on information and systems E90-D(1), 271-282, 2007-01-01
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