固相反応法により作成したMn_2Sb化合物薄膜の配向制御と磁気特性 Control of Preferred Orientation and Magnetic Property of Mn_2Sb Thin Films Fabricated by Solid State Reaction

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Thin films of Mn<SUB>2</SUB>Sb were prepared by solid state mutual reactions in multilayered films consisting of Mn and Sb which were made by ion beam sputtering. Microstructure of the films was investigated by means of small and large angle X-ray diffraction (XRD), and cross-sectional transmission electron microscopy (TEM). Modulation wavelength of the multilayered films and discharging power for an ion source during sputtering determined the microstructural feature in the interdiffused region between the Mn and Sb layers, which was a dominant factor governing the texture development of the Mn<SUB>2</SUB>Sb phase on annealing. It can be concluded that the oriented nucleation process during deposition plays a significant role for the development of preferred orientation of the reacted compounds.

収録刊行物

  • 粉体および粉末冶金  

    粉体および粉末冶金 43(8), 955-960, 1996-08-15 

    Japan Society of Powder and Powder Metallurgy

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各種コード

  • NII論文ID(NAID)
    10002012737
  • NII書誌ID(NCID)
    AN00222724
  • 本文言語コード
    JPN
  • 資料種別
    ART
  • ISSN
    05328799
  • NDL 記事登録ID
    4012516
  • NDL 雑誌分類
    ZP41(科学技術--金属工学・鉱山工学)
  • NDL 請求記号
    Z17-274
  • データ提供元
    CJP書誌  NDL  J-STAGE 
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