κ-アルミナのX線回折データについて X-ray Diffraction Data on κ-Alumina
κ-alumina films were deposited on WC-Co alloy by a CVD method with an under layer of TiC. Powder samples were also prepared by disolving steel sheets on which TiC/Al<SUB>2</SUB>O<SUB>3</SUB> or TiC/Al<SUB>2</SUB>O<SUB>3</SUB>/TiN were deposited. These specimens were examined by X-ray diffraction to obtain more exact diffraction data for practical use.<BR>Diffraction profiles of the films and the powders were analyzed with a hexagonal system. CVD-coated films showed strong orientation, namely c-axis being rectangular to the film plane. κ-Al<SUB>2</SUB>O<SUB>3</SUB> has lattice constants of a<SUB>0</SUB>=9.632A and c<SUB>0</SUB>=8.929A as a hexagonal system. These values correspond to a<SUB>0</SUB>=4.816A, b<SUB>0</SUB>=8.342A and c<SUB>0</SUB>=8.929A of an orthorhombic system.
粉体および粉末冶金 44(1), 96-101, 1997-01-15
Japan Society of Powder and Powder Metallurgy