κ-アルミナのX線回折データについて X-ray Diffraction Data on κ-Alumina

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κ-alumina films were deposited on WC-Co alloy by a CVD method with an under layer of TiC. Powder samples were also prepared by disolving steel sheets on which TiC/Al<SUB>2</SUB>O<SUB>3</SUB> or TiC/Al<SUB>2</SUB>O<SUB>3</SUB>/TiN were deposited. These specimens were examined by X-ray diffraction to obtain more exact diffraction data for practical use.<BR>Diffraction profiles of the films and the powders were analyzed with a hexagonal system. CVD-coated films showed strong orientation, namely c-axis being rectangular to the film plane. κ-Al<SUB>2</SUB>O<SUB>3</SUB> has lattice constants of a<SUB>0</SUB>=9.632A and c<SUB>0</SUB>=8.929A as a hexagonal system. These values correspond to a<SUB>0</SUB>=4.816A, b<SUB>0</SUB>=8.342A and c<SUB>0</SUB>=8.929A of an orthorhombic system.

収録刊行物

  • 粉体および粉末冶金  

    粉体および粉末冶金 44(1), 96-101, 1997-01-15 

    Japan Society of Powder and Powder Metallurgy

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各種コード

  • NII論文ID(NAID)
    10002013354
  • NII書誌ID(NCID)
    AN00222724
  • 本文言語コード
    JPN
  • 資料種別
    ART
  • ISSN
    05328799
  • NDL 記事登録ID
    4118705
  • NDL 雑誌分類
    ZP41(科学技術--金属工学・鉱山工学)
  • NDL 請求記号
    Z17-274
  • データ提供元
    CJP書誌  NDL  J-STAGE 
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