新しい迅速X線回折装置による結晶構造解析の発展 Recent Development of X-ray Crystal Structure Analysis by a New Diffractometer for Rapid Data Collection

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Recently we designed and made a new no-screen Weissenberg camera type diffractometer for rapid data collection to determine the structures of reaction intermediates. The new features of the diffractometer are a κ-type goniometer, two imaging plates for recording and reading the intensity data, and spiral motion reading mechanism. The crystal mounted on a goniometer is aligned automatically and the three-dimensional intensity data were collected within two hours. Using this new diffractometer, we determined the structure of a syn-tricyclooctane derivative. The structure has not been analyzed with the four-circle diffratometer because the molecule easily reacts under X-ray irradiation .

収録刊行物

  • 日本結晶学会誌  

    日本結晶学会誌 37(1), 42-47, 1995-02-28 

    The Crystallographic Society of Japan

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各種コード

  • NII論文ID(NAID)
    10002023963
  • NII書誌ID(NCID)
    AN00188364
  • 本文言語コード
    JPN
  • 資料種別
    ART
  • ISSN
    03694585
  • NDL 記事登録ID
    3595186
  • NDL 雑誌分類
    ZM46(科学技術--地球科学--岩石・鉱物・鉱床)
  • NDL 請求記号
    Z15-138
  • データ提供元
    CJP書誌  NDL  J-STAGE 
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