新しい迅速X線回折装置による結晶構造解析の発展 [in Japanese] Recent Development of X-ray Crystal Structure Analysis by a New Diffractometer for Rapid Data Collection [in Japanese]
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Recently we designed and made a new no-screen Weissenberg camera type diffractometer for rapid data collection to determine the structures of reaction intermediates. The new features of the diffractometer are a κ-type goniometer, two imaging plates for recording and reading the intensity data, and spiral motion reading mechanism. The crystal mounted on a goniometer is aligned automatically and the three-dimensional intensity data were collected within two hours. Using this new diffractometer, we determined the structure of a syn-tricyclooctane derivative. The structure has not been analyzed with the four-circle diffratometer because the molecule easily reacts under X-ray irradiation .
X-RAYS 37(1), 42-47, 1995-02-28
The Crystallographic Society of Japan