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- 植草 秀裕
- 東京工業大学理学部化学科
書誌事項
- タイトル別名
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- Special Issue-Dynamics of Molecular Crystals. Recent Development of X-ray Crystal Structure Analysis by a New Diffractmeter for Rapid Data Collection.
- アタラシイ ジンソク Xセン カイセツ ソウチ ニ ヨル ケッショウ コウゾウ
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Recently we designed and made a new no-screen Weissenberg camera type diffractometer for rapid data collection to determine the structures of reaction intermediates. The new features of the diffractometer are a κ-type goniometer, two imaging plates for recording and reading the intensity data, and spiral motion reading mechanism. The crystal mounted on a goniometer is aligned automatically and the three-dimensional intensity data were collected within two hours. Using this new diffractometer, we determined the structure of a syn-tricyclooctane derivative. The structure has not been analyzed with the four-circle diffratometer because the molecule easily reacts under X-ray irradiation .
収録刊行物
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- 日本結晶学会誌
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日本結晶学会誌 37 (1), 42-47, 1995
日本結晶学会
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詳細情報 詳細情報について
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- CRID
- 1390282679064419840
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- NII論文ID
- 10002023963
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- NII書誌ID
- AN00188364
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- ISSN
- 18845576
- 03694585
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- NDL書誌ID
- 3595186
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可