SMTを用いた点接触法による表面電気伝導の測定 [in Japanese] Measurements of Surface State Conductivity with a Point Contact Method using STM [in Japanese]
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Electrical conductance of point contacts between a metal tip and semiconductor surfaces has been measured with scanning tunneling microscope (STM) . The conductance depends strongly on the electronic structures of semiconductor surfaces. It also changes with a distribution of steps around its contact area. These results suggest that it is due to the conductivity via surface electronic states, that is, surface state conductivity.
X-RAYS 37(5), 251-257, 1995-10-31
The Crystallographic Society of Japan