Measurements of Surface State Conductivity with a Point Contact Method using STM.

• HASEGAWA Yukio

  東北大学金属材料研究所

Bibliographic Information

Other Title

• ＳＴＭを用いた点接触法による表面電気伝導の測定
• STM オ モチイタ テンセッショクホウ ニヨル ヒョウメン デンキ デンドウ

Abstract

Electrical conductance of point contacts between a metal tip and semiconductor surfaces has been measured with scanning tunneling microscope (STM) . The conductance depends strongly on the electronic structures of semiconductor surfaces. It also changes with a distribution of steps around its contact area. These results suggest that it is due to the conductivity via surface electronic states, that is, surface state conductivity.

Journal

• Nihon Kessho Gakkaishi

  Nihon Kessho Gakkaishi 37 (5), 251-257, 1995

  The Crystallographic Society of Japan

Details

• CRID: 1390282679063601536
• NII Article ID: 10002024391
• NII Book ID: AN00188364
• DOI: 10.5940/jcrsj.37.251
• ISSN: 18845576
• ISSN: 03694585
• NDL BIB ID: 3636124
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I3636124
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed