TEM and AFM of Fine Structure in Polymer Friction-Transfer Layers.

• J. Christopher

  Laboratoire de Polymères, École Polytechnique Fédérale de Lausanne

• Plummer G.

  Laboratoire de Polymères, École Polytechnique Fédérale de Lausanne

• Kausch Hans-Henning

  Laboratoire de Polymères, École Polytechnique Fédérale de Lausanne

書誌事項

タイトル別名

• TEM and AFM of Fine Structure in Polyme

抄録

Oriented films of PTFE, UHMWPE and Vectra, ^TM prepared by friction transfer, have been investigated using transmission electron microscopy (TEM) and atomic force microscopy (AFM), and the results have been compared. These techniques can provide molecular resolution of the internal structure and the sample surface respectively, with certain limitations. Molecular imaging with AFM has the advantage of not being limited to crystallographic planes showing strong Bragg reflections and belonging to zones whose axis is parallel to the observation direction. On the other hand, high-resolution AFM images generally correspond to very restricted sample areas (typically≤200nm²), so that large numbers of images may be necessary to obtain a reasonable representation of a heterogeneous sample surface.

収録刊行物

• 繊維学会誌

  繊維学会誌 53 (12), 555-564, 1997

  社団法人 繊維学会

キーワード

• Polymers
• Oriented films
• HREM
• AFM

詳細情報

• CRID: 1390282679804862592
• NII論文ID: 130004205916
• NII論文ID: 10002058617
• NII書誌ID: AN00131651
• DOI: 10.2115/fiber.53.12_555
• ISSN: 18842259
• ISSN: 00379875
• NDL書誌ID: 4367029
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4367029
• Web Site: http://www.jstage.jst.go.jp/article/fiber1944/53/12/53_12_555/_pdf
• 本文言語コード: en
• データソース種別:
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• 抄録ライセンスフラグ: 使用不可