書誌事項
- タイトル別名
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- A Sample Preparation Method for Paper Cross-Sections using a Focused Ion Beam.
- カミ ノ ダンメン シリョウ サクセイホウ
この論文をさがす
抄録
A new preparation technique of cross-section for examining the fine structure of fiber and paper was investigated. A critical point in the structural characterization study of paper is to prepare cross-sections in a way the structure remains unchanged. However, the destruction of internal structure or creation of artifact in the thin sections during their preparation process even in a epoxy resin embedded sample is not avoidable. A focused ion beam (FIB) technique was applied as an improved method for a variety of papers. This technique has specially been used for fine processing of semiconductor or metals. Advantageous points of this method are as follows; (1) Sample temperature during the beam cutting is kept lower than 40°C, (2) Any optional area can be selected for sectioning, (3) A two step irradiation method is applicable for anisotropic composite materials. As a result, smooth cross-sections of a woodfree compressible paper and a double coated paper composed of materials with different hardness were successfully prepared and the micrographs with no structural change or artifact was satisfactory obtained. Further, a clear observation of printed ink transferred to paper was realized for the first time by this method.
収録刊行物
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- 繊維学会誌
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繊維学会誌 54 (7), 360-366, 1998
社団法人 繊維学会
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キーワード
詳細情報
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- CRID
- 1390001204829908992
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- NII論文ID
- 10002059768
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- NII書誌ID
- AN00131651
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- ISSN
- 18842259
- 00379875
- http://id.crossref.org/issn/00379875
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- NDL書誌ID
- 4535613
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可