Experimental Study on Fabrication Technique of a Ni/Ti Supermirror using the Electron Beam Evaporation System

この論文にアクセスする

この論文をさがす

著者

抄録

Basic study on the fabrication technique of a Ni/Ti supermirror using the vacuum evaporation system with an electron gun has been carried out to improve the neutron reflectivity.<BR>The substrate roughness dependency to the reflectivity was investigated using polished glass floats with different surface roughnesses using neutron reflectometry. It was concluded that the substrate roughness in the order of several sub-nanometers was very sensitive to the neutron reflectivity of the Ni/Ti supermirror. The reflectivity was improved to 80% for the Ni/Ti supermirror with an effective critical angle of 2 times that of natural nickel using fine polished glass substrate with a surface roughness of 0.51nm rms.<BR>The effect of oxidizing Ni and Ti layers to the neutron reflectivity, which were deposited by changing the oxygen gas conditions in the chamber, was investigated. The oxidation effect prevents the deformation of the Ni/Ti supermirror structure, and the reflectivity shows an increase of almost 20% for the Ni/Ti supermirror with an effective critical angle of 2.6 times that of natural nickel by depositing in an atmosphere of oxygen gas with a partial pressure of 1×10<SUP>-5</SUP> Torr.<BR>From the depth profile by X-ray photoelectron measurement (XPM) and neutron reflectometry results, it was concluded that the reflectivity increase by oxidation mentioned is caused by decreasing the interface roughness and the interfacial diffusion between Ni and Ti layer, and it is not caused by forming a NiO compound which increases the scattering potential of the Ni layer.

収録刊行物

  • Journal of nuclear science and technology

    Journal of nuclear science and technology 35(11), 750-758, 1998-11-25

    Atomic Energy Society of Japan

参考文献:  10件中 1-10件 を表示

  • <no title>

    MEZEI F.

    Commun. Phys. 1, 81, 1976

    被引用文献1件

  • <no title>

    MEZEI F.

    Commun. Phys. 2, 41, 1977

    被引用文献1件

  • <no title>

    Ebisawa T.

    J. Nucl. Sci. Technol. 16, 647, 1979

    被引用文献2件

  • <no title>

    KEEM J. E.

    SPIE Semin. Proc. 983, 38, 1988

    被引用文献1件

  • <no title>

    TASAKI S.

    Nucl. Instr. and Meth. in Phys. Res. A 335, 501-505, 1995

    被引用文献1件

  • <no title>

    SAXENA A. M.

    SPIE Semin. Proc. 983, 31-37, 1988

    被引用文献1件

  • <no title>

    SAMUEL F.

    SPIE Semin. Proc. 1738, 54-66, 1992

    被引用文献1件

  • <no title>

    SINHA S. K.

    Phys. Rev. B38, 2297, 1988

    被引用文献11件

  • <no title>

    MOULDER J. F.

    Handbook of X-ray Photoelectron Spectro scopy, 1995

    被引用文献15件

  • <no title>

    EBISAWA T.

    Phys. B 213-214, 901, 1995

    DOI 被引用文献7件

各種コード

  • NII論文ID(NAID)
    10002080267
  • NII書誌ID(NCID)
    AA00703720
  • 本文言語コード
    ENG
  • 資料種別
    ART
  • ISSN
    00223131
  • NDL 記事登録ID
    4607760
  • NDL 雑誌分類
    ZM35(科学技術--物理学)
  • NDL 請求記号
    Z53-A460
  • データ提供元
    CJP書誌  NDL  J-STAGE 
ページトップへ