A New Method for Determination of Energy Distribution of Interface States in Semiconductor Band-Gaps : XPS Measurements under Biases

  • KOBAYASHI Hikaru
    Department of Chemistry, Faculty of Engineering Science, and Research Center for Photoenergetics of Organic Materials, Osaka University

Bibliographic Information

Other Title
  • X線光電子分光法を用いた半導体のバンドギャップ内の界面準位の新しい観測方法

Search this article

Journal

References(33)*help

See more

Details

  • CRID
    1570854174090732800
  • NII Article ID
    10002115376
  • NII Book ID
    AN00334149
  • ISSN
    03885321
  • Text Lang
    ja
  • Data Source
    • CiNii Articles

Report a problem

Back to top