A New Method for Determination of Energy Distribution of Interface States in Semiconductor Band-Gaps : XPS Measurements under Biases
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- KOBAYASHI Hikaru
- Department of Chemistry, Faculty of Engineering Science, and Research Center for Photoenergetics of Organic Materials, Osaka University
Bibliographic Information
- Other Title
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- X線光電子分光法を用いた半導体のバンドギャップ内の界面準位の新しい観測方法
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Journal
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- 表面科学
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表面科学 16 (4), 251-257, 1995-04-10
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Details
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- CRID
- 1570854174090732800
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- NII Article ID
- 10002115376
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- NII Book ID
- AN00334149
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- ISSN
- 03885321
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- Text Lang
- ja
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- Data Source
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- CiNii Articles