Correction of Specimen Orientation in Three-Dimensional Measurement of Surface Roughness with Small Waviness by Contact Stylus Instrument (2nd Report)

• CHO Nahmgyoo

  Graduate School of Science and Engineering, Tokyo Institute of Technology

• TSUKADA Tadao

  Faculty Engineering, Tokyo Institute of Technology

• TAKAHASHI Masaaki

  Faculty Engineering, Tokyo Institute of Technology

収録刊行物

• International journal of the Japan Society for Precision Engineering

  International journal of the Japan Society for Precision Engineering 29 (3), 253-258, 1995-09-30

キーワード

• surface roughness
• measurement
• three-dimension
• instrument
• control
• orientation
• profilometer

詳細情報

• CRID: 1570009749147978496
• NII論文ID: 10002161504
• NII書誌ID: AA1080710X
• ISSN: 0916782X
• 本文言語コード: en
• データソース種別:
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