電子線プローブマイクロアナライザー(EPMA)によるFe^<2+>/Fe^<3+>値マッピング Fe^<2+>/Fe^<3+> Mapping with an Electron Probe Microanalyzer (EPMA)

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著者

    • 加藤 丈典 KATO Takenori
    • 名古屋大学大学院理学研究科地球惑星理学 Department of Earth and Planetary Sciences, Graduate School of Science, Nagoya University.

抄録

The relative intensities of Fe Lα<SUB>1, 2</SUB> and Lβ<SUB>1</SUB> X-ray emission peaks differ significantly with valance state and bond association. These X-ray emission peaks cannot be distinguished from each other using an energy-dispersive spectrometer (EDS), because the difference in energy between these peaks is smaller than the spectral resolution of EDS (approximately 100-150 eV). However, these emission peaks can be distinguished from each other using a wavelength-dispersive spectrometer (WDS). A crystal whose 2d value is about 60 A is considered to be suitable for analyzing the first order of Fe Lα<SUB>1, 2</SUB> and L β<SUB>1</SUB> X-ray emission peaks. The second order of these peaks can also be analyzed using lead stearate (STE : 2d=100.4 Å) crystal. Although it is difficult to use the ' peak seek' routine for a mapping analysis, the effects of chemical shifts can be suppressed by configuring the spectrometer. The interferences of high orders of Si and Na emission peaks can be suppressed by a pulse height analysis. Applying a mapping technique to measuring Fe Lα <SUB>1, 2</SUB> and Lβ<SUB>1</SUB> emission peaks, Fe<SUP>2+</SUP>/Fe<SUP>3+</SUP> mapping can be obtained using an electron probe microanalyzer.

収録刊行物

  • 地學雜誌  

    地學雜誌 108(2), 122-131, 1999-04-25 

    Tokyo Geographical Society

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各種コード

  • NII論文ID(NAID)
    10002238904
  • NII書誌ID(NCID)
    AN00322536
  • 本文言語コード
    JPN
  • 資料種別
    ART
  • ISSN
    0022135X
  • NDL 記事登録ID
    4780782
  • NDL 雑誌分類
    ZM41(科学技術--地球科学)
  • NDL 請求記号
    Z15-169
  • データ提供元
    CJP書誌  NDL  J-STAGE 
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