近接場光学顕微鏡の基本性能とその応用分野 Basic Performance of Near-Field Optical Microscope and Its Applications

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著者

    • 斎木 敏治 SAIKI Toshiharu
    • 神奈川科学技術アカデミー・光極微機能プロジェクト Nano-Optical Dynamics Project, Kanagawa Academy of Science and Technology

抄録

The principles of aperture- and scattering (apertureless)-type near-field optical microscopies (NOM), their related techniques, and their applications are summarized. In terms of a key device of the aperture-type NOM, the functional performance of an optical fiber probe with a small metal aperture is demonstrated through measurement of the photoluminescence image of single quantum dots. In the range of 50-100nm spatial resolution, the aperture-type NOM is an established and reliable technique for the spectroscopy of highly localized structures: spatially resolved spectroscopy of the surface of semiconductor materials or spectroscopic analysis of single particles, such as single molecules, single quantum dots, single metal particles, and so on. The scattering-type NOM, on the other hand, is a promising device to be applied to the surface enhanced spectroscopy, nano-manufacturing, and high density optical memory with higher spatial accuracy and higher efficiency.

収録刊行物

  • 表面科学  

    表面科学 20(5), 344-351, 1999-05-10 

    The Surface Science Society of Japan

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各種コード

  • NII論文ID(NAID)
    10002267912
  • NII書誌ID(NCID)
    AN00334149
  • 本文言語コード
    JPN
  • 資料種別
    REV
  • ISSN
    03885321
  • NDL 記事登録ID
    4720359
  • NDL 雑誌分類
    ZM35(科学技術--物理学)
  • NDL 請求記号
    Z15-379
  • データ提供元
    CJP書誌  NDL  J-STAGE 
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