TOF study on electronic sputtering of SiO_2 bombarded by MeV energy heavy ions

  • OTA H
    Department of Nuclear Engineering, Kyoto University
  • NINOMIYA S
    Department of Nuclear Engineering, Kyoto University
  • IMAI M
    Department of Nuclear Engineering, Kyoto University
  • ITOH A
    Department of Nuclear Engineering, Kyoto University
  • IMANISHI N
    Department of Nuclear Engineering, Kyoto University

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詳細情報 詳細情報について

  • CRID
    1573950398832583424
  • NII論文ID
    10002402642
  • NII書誌ID
    AA11068271
  • 本文言語コード
    en
  • データソース種別
    • CiNii Articles

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