ELECRON ENERGY-LOSS RATES IN GASEOUS Kr AND Xe DETERMINED FROM TRANSIENT MICROWAVE CONDUCTIVITY

• SUNAGAWA T

  Fukui Institute of Technology

• KATO H

  Fukui Institute of Technology

• SHIMAMORI H

  Fukui Institute of Technology

• TAKAMUKU S

  Fukui Institute of Technology

Journal

• Atomic collision research in Japan

  Atomic collision research in Japan 24 127-129, 1998-11

Details

• CRID: 1574231873809196544
• NII Article ID: 10002402833
• NII Book ID: AA11068271
• Text Lang: en
• Data Source:
  • CiNii Articles