Direct ICP-AES Determination of Trace Impurities in Silicon Dioxide Using Fluorinating Electrothermal Vaporization with Slurry Sampling.

• PENG Tianyou

  Department of Chemistry, Wuhan University

• JIANG Zucheng

  Department of Chemistry, Wuhan University

Bibliographic Information

Other Title

• Direct ICP-AES Determination of Trace I

Abstract

Based on the selective volatilization taking place between the matrix and the analyte in the graphite furnace, a new method for a direct ICP-AES determination of trace impurities in SiO₂ powder using electrothermal vaporization (ETV) as a slurry-sampling technique is described. A polytetrafluoroethylene (PTFE) emulsion is used as a fluorinating reagent to promote the vaporization of impurity elements from SiO₂ powder. The fluorinating vaporization and transportation behaviors, the matrix effects and the particle-size effects have been investigated systematically. When the sampling volumes are 10μl, the detection limits of Cu, Cr, Fe and Ti are 1.05, 1.58, 1.06 and 0.9μg l^-1, respectively, and the RSDs are in the range of 1.9-4.1%. The proposed method has been applied to analyze SiO₂ powder without any chemical pretreatment. The determined values are in good agreement with the results obtained by using acid decomposition-pneumatic nebulization ICP-AES.

Journal

• Analytical Sciences

  Analytical Sciences 13 (4), 595-599, 1997

  The Japan Society for Analytical Chemistry

Keywords

• Selective volatilization
• electrothermal vaporization
• inductively coupled plasma atomic emission spectroscopy
• trace impurities
• silicon dioxide slurry
• polytetrafluoroethylene emulsion

Details

• CRID: 1390001204253441920
• NII Article ID: 130003528180
• NII Article ID: 10002412232
• NII Book ID: AA10500785
• DOI: 10.2116/analsci.13.595
• COI: 1:CAS:528:DyaK2sXlsVCltL0%3D
• ISSN: 13482246
• ISSN: 09106340
• NDL BIB ID: 4277871
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4277871
• Web Site: https://link.springer.com/content/pdf/10.2116/analsci.13.595.pdf
• Web Site: https://link.springer.com/article/10.2116/analsci.13.595/fulltext.html
• Web Site: http://www.jstage.jst.go.jp/article/analsci1985/13/4/13_4_595/_pdf
• Text Lang: en
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed