A Simulation Study of Signal to Background Ratio of XANES by Total Electron Yield at Grazing Angle.

• ZHENG Songyan

  Department of Applied Chemistry, School of Engineering, University of Tokyo

• GOHSHI Yohichi

  Department of Applied Chemistry, School of Engineering, University of Tokyo

Bibliographic Information

Other Title

• Simulation Study of Signal to Backgroun

Abstract

Numerical simulations of X-ray absorption near edge structure (XANES) of Au L₃-edge have been done by total electron yield (TEY) at grazing incidence angles of 12mrad and 4mrad. A 4mrad incidence angle is a total reflection condition and a 12mrad incidence angle is above the total reflection state. The results of calculations show that the signal to background ratio (S/B) of XANES at incidence angle of 4mrad is greater than that at incidence angle of 12mrad. Experimental results are in agreement with numerical simulations.

Journal

• Analytical Sciences

  Analytical Sciences 13 (6), 997-1001, 1997

  The Japan Society for Analytical Chemistry

Keywords

• X-ray adsorption near edge structure
• X-ray photoelectron spectroscopy
• total electron yield
• conversion electron yield
• X-ray total reflection
• critical angle

Details

• CRID: 1390001204252267648
• NII Article ID: 130003528260
• NII Article ID: 10002413565
• NII Book ID: AA10500785
• DOI: 10.2116/analsci.13.997
• COI: 1:CAS:528:DyaK2sXotVWlsr4%3D
• ISSN: 13482246
• ISSN: 09106340
• NDL BIB ID: 4357483
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4357483
• Web Site: https://link.springer.com/content/pdf/10.2116/analsci.13.997.pdf
• Web Site: https://link.springer.com/article/10.2116/analsci.13.997/fulltext.html
• Web Site: http://www.jstage.jst.go.jp/article/analsci1985/13/6/13_6_997/_pdf
• Text Lang: en
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed