TXRF Analysis of Solution Samples Using Polyester Film as a Disposable Sample-Carrier Cover
The performance of polyester film was examined as a disposable cover of the sample-carrier (silicon wafer). The cover offers convenience and economy for the total reflection X-ray fluorescence (TXRF) analysis of solution samples. Moreover, the measurement of Al Kα (1.487 keV) and P Kα (2.013 keV) peaks is possible because of the reduction of Si Kα X-rays (1.740 keV) from the sample-carrier. Not only the trace elements (Cr, Mn, Co, Ni and Cu) but also the low sensitivity elements (Al and P) in JSS iron and steel standard samples were successfully analyzed.
- Analytical sciences : the international journal of the Japan Society for Analytical Chemistry
Analytical sciences : the international journal of the Japan Society for Analytical Chemistry 14(5), 909-912, 1998-10-10