TXRF Analysis of Solution Samples Using Polyester Film as a Disposable Sample-Carrier Cover.

• YAMAGUCHI Hitoshi

  National Research Institute for Metals

• ITOH Shinji

  National Research Institute for Metals

• IGARASHI Shukuro

  Department of Materials Science, Faculty of Engineering, Ibaraki University

• NAITOH Kunishige

  Department of Materials Science, Faculty of Engineering, Ibaraki University

• HASEGAWA Ryosuke

  National Research Institute for Metals

Bibliographic Information

Other Title

• TXRF Analysis of Solution Samples Using

Abstract

The performance of polyester film was examined as a disposable cover of the sample-carrier (silicon wafer). The cover offers convenience and economy for the total reflection X-ray fluorescence (TXRF) analysis of solution samples. Moreover, the measurement of Al K_α (1.487 keV) and P K_α (2.013 keV) peaks is possible because of the reduction of Si K_α X-rays (1.740 keV) from the sample-carrier. Not only the trace elements (Cr, Mn, Co, Ni and Cu) but also the low sensitivity elements (Al and P) in JSS iron and steel standard samples were successfully analyzed.

Journal

• Analytical Sciences

  Analytical Sciences 14 (5), 909-912, 1998

  The Japan Society for Analytical Chemistry

Keywords

• Analytical Chemistry

Details

• CRID: 1390282679235035904
• NII Article ID: 10002417200
• NII Book ID: AA10500785
• DOI: 10.2116/analsci.14.909
• COI: 1:CAS:528:DyaK1cXmslWqurs%3D
• ISSN: 13482246
• ISSN: 09106340
• NDL BIB ID: 4576986
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4576986
• Web Site: https://link.springer.com/content/pdf/10.2116/analsci.14.909.pdf
• Web Site: https://link.springer.com/article/10.2116/analsci.14.909/fulltext.html
• Web Site: http://www.jstage.jst.go.jp/article/analsci/14/5/14_5_909/_pdf
• Text Lang: en
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed