Analysis of Small Amounts of Sample by Infra-Red Microscope (Application of FT-IR Microscopy)

• KAMOTO Ritsu

  TORAY Corporation, Research Center

Bibliographic Information

Other Title

• 赤外線による微小試料の分析 (赤外顕微鏡の応用)

Journal

• 日本赤外線学会誌 = Journal of the Japan Society of Infraed Science and Technolog

  日本赤外線学会誌 = Journal of the Japan Society of Infraed Science and Technolog 5 (2), 113-125, 1995-12-20

Keywords

• microscopy
• diffraction
• inclusions
• LCD
• contaminants
• contact
• bow-tie tree
• mapping

Details

• CRID: 1572543023947074048
• NII Article ID: 10002436280
• NII Book ID: AN10433588
• ISSN: 09167900
• Text Lang: ja
• Data Source:
  • CiNii Articles