Image Simulation of Partial Dislocation Lines Plan-viewed by High Resolution Electron Microscopy

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著者

    • KANEMATSU E.
    • Department of Applied Physics, Faculty of Engineering, The University of Tokyo
    • INOUE M.
    • Department of Applied Physics, Faculty of Engineering, The University of Tokyo
    • AMASUGA H.
    • Department of Applied Physics, Faculty of Engineering, The University of Tokyo
    • NAKAMURA M.
    • Department of Applied Physics, Faculty of Engineering, The University of Tokyo
    • MAEDA K.
    • Department of Applied Physics, Faculty of Engineering, The University of Tokyo

収録刊行物

  • Materials transactions, JIM  

    Materials transactions, JIM 37(3), 273-278, 1996-03 

参考文献:  13件

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各種コード

  • NII論文ID(NAID)
    10002447237
  • NII書誌ID(NCID)
    AA10699969
  • 本文言語コード
    ENG
  • 資料種別
    ART
  • ISSN
    09161821
  • データ提供元
    CJP書誌 
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