Quantification of Sulfur in Copper by Secondary Ion Mass Spectrometry(SIMS)
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- NAKADA Yoshinobu
- Central Research Institute, Mitsubishi Materials Corporation
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- MINE Kazuhisa
- Central Research Institute, Mitsubishi Materials Corporation
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- KOUTSUKA Toshimoto
- Central Research Institute, Mitsubishi Materials Corporation
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- SASSA Koichi
- Central Research Institute, Mitsubishi Materials Corporation
この論文をさがす
収録刊行物
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- Materials transactions, JIM
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Materials transactions, JIM 37 (5), 1004-1007, 1996-05
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詳細情報 詳細情報について
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- CRID
- 1571417124042957952
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- NII論文ID
- 10002449201
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- NII書誌ID
- AA10699969
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- ISSN
- 09161821
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles