Anomalous X-ray Scattering Method for Determining Electron Density Distribution in Amorphous Selenium

• SAITO Masatoshi

  Institute for Advanced Materials Processing, Tohoku University

• WASEDA Yoshio

  Institute for Advanced Materials Processing, Tohoku University

Journal

• Mater. Trans., JIM

  Mater. Trans., JIM 37 (5), 1026-1029, 1996-05

Keywords

• electron density distribution
• anomalous X-ray scattering electron-ion correlation
• amorphous selenium
• liquid metal

Details

• CRID: 1570009749159403904
• NII Article ID: 10002449263
• NII Book ID: AA10699969
• ISSN: 09161821
• Text Lang: en
• Data Source:
  • CiNii Articles