Precise Morphology Analysis on Platelet-type Hematite Particles by Transmission Electron Microscopy.

• Nishino Daisuke

  Graduate Student, Tohoku University

• Nakafuji Atsushi

  Institute for Advanced Materials Processing, Tohoku University

• Yang Jun-Mo

  Institute for Advanced Materials Processing, Tohoku University

• Shindo Daisuke

  Institute for Advanced Materials Processing, Tohoku University

抄録

The morphological characterization on platelet-type hematite particles was carried out extensively by transmission electron microscopy (TEM). It was found that the thickness of platelet-type hematite particles could be precisely measured from TEM images and convergent-beam electron diffraction (CBED) patterns with the use of the imaging plate. Based on these analyses coupled with electron energy-loss spectroscopy (EELS) which is useful to evaluate the specimen thickness with a simple manner, the mean-free path for inelastic electron scattering of hematite was determined to be 120 nm at an accelerating voltage of 200 kV. Thus, it is expected that the thickness of other hematite particles with various shapes, which is difficult to measure from TEM images and CBED patterns, can now be easily evaluated through EELS.

収録刊行物

• ＩＳＩＪ　Ｉｎｔｅｒｎａｔｉｏｎａｌ

  ＩＳＩＪ　Ｉｎｔｅｒｎａｔｉｏｎａｌ 38 (12), 1369-1374, 1998

  一般社団法人 日本鉄鋼協会

キーワード

• morphological characterization
• platelet-type hematite particle
• transmission electron microscopy
• convergent-beam electron diffraction
• electron energy-loss spectroscopy
• specimen thickness
• mean-free path for inelastic electron scattering

詳細情報

• CRID: 1390001206451847936
• NII論文ID: 10002461783
• NII書誌ID: AA10680712
• DOI: 10.2355/isijinternational.38.1369
• ISSN: 13475460
• ISSN: 09151559
• Web Site: http://www.jstage.jst.go.jp/article/isijinternational1989/38/12/38_12_1369/_pdf
• 本文言語コード: en
• データソース種別:
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• 抄録ライセンスフラグ: 使用不可