ケイ素鉄単結晶(001)試料の2次電子スピン計測 [in Japanese] Spin-polarization Measurement of the Secondary Electrons Emitted from Silicon Steel Single Crystal (001) Surface [in Japanese]
Access this Article
Search this Article
A spin-polarized scanning electron microscope (SP-SEM) which operates in reflection high energy electron diffraction (RHEED) mode of the primary electron beam has been developed. This apparatus opens a way to relate the magnetic domain structures with the surface crystal structure directly. This report describes the observation of SP-SEM images with corresponding RHEED patterns of a silicon steel single crystal (001) surface.
- Journal of the Vacuum Society of Japan
Journal of the Vacuum Society of Japan 42(3), 357-360, 1999-03
The Vacuum Society of Japan