High Speed/High Frequency Technology and EMC. High-frequency measurement techniques. Compliance.

• IZUMI Seiichi

  Ikoma Testing Laboratory, Kansai Electronic Industry Development Center

Bibliographic Information

Other Title

• 高速化・高周波化対応とＥＭＣ　高周波測定技術　コンプライアンス
• コンプライアンス

Journal

• The Journal of Japan Institute for Interconnecting and Packaging Electronic Circuits

  The Journal of Japan Institute for Interconnecting and Packaging Electronic Circuits 12 (5), 306-311, 1997

  The Japan Institute of Electronics Packaging

Details

• CRID: 1390001204666857216
• NII Article ID: 10002522645
• NII Book ID: AN10564349
• DOI: 10.5104/jiep1995.12.306
• ISSN: 18841201
• ISSN: 13410571
• NDL BIB ID: 4275477
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4275477
• Web Site: http://www.jstage.jst.go.jp/article/jiep1995/12/5/12_5_306/_pdf
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles