AFM QUANTITATIVE DATA PROVIDES A NEW UNDERSTANDING OF MICRO-ELECTRODISCHARGE MACHINED SURFACES

1 Citations 5 References
  • ALLEN David M.
    School of Industrial and Manufacturing Science, Cranfield University
  • HUANG Sue X.
    School of Industrial and Manufacturing Science, Cranfield University

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Details 詳細情報について

  • CRID
    1571417124044939264
  • NII Article ID
    10002524462
  • NII Book ID
    AN10564586
  • ISSN
    13417908
  • Text Lang
    en
  • Data Source
    • CiNii Articles

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