EELS Analysis and Radiation Effect of SiC Crystals

• Hojou Kiichi

  Dept. of Materials Science, JAERI

Bibliographic Information

Other Title

• 炭化珪素 (SiC) の照射損傷とEELS分析

Journal

• Materia Japan

  Materia Japan 37 (12), 984-984, 1998

  The Japan Institute of Metals and Materials

Keywords

• SiC crystal
• in-situ obsavation
• electron energy loss spectrocopy
• dual-ion beam irradiation
• bubble
• amorohization
• power electronics

Details

• CRID: 1390001204079994368
• NII Article ID: 10002546673
• NII Book ID: AN10433227
• DOI: 10.2320/materia.37.984
• ISSN: 18845843
• ISSN: 13402625
• Web Site: https://www.jstage.jst.go.jp/article/materia1994/37/12/37_12_984/_pdf
• Data Source:
  • JaLC
  • Crossref
  • CiNii Articles