表面電位分布測定による水膜観察の可能性

• 升田 博之

  金属材料技術研究所

書誌事項

タイトル別名

• Possibility of Observation of Water Film by Measuring Surface Potential Distribution
• ヒョウメン デンイ ブンプ ソクテイ ニ ヨル スイ マク カンサツ ノ カノウセイ

抄録

Previous AFM observation showed that small water droplets and water film were observed on the surface when pure water or aqueous solution was poured on graphite or mica. However, when the specimen surface was dirty and too rough to observe very thin water film like roughly polished metal surface, we cannot decide whether the water film exists or not. The possibility of measurement of water film distribution by surface potential measurement was studied. As the result, it is proved that surface potential becomes low when the water film exists and the thin water film which cannot be distinguished from the surface shape can be observed by measuring the surface potential distribution.

収録刊行物

• 日本金属学会誌

  日本金属学会誌 62 (12), 1183-1188, 1998

  公益社団法人 日本金属学会

キーワード

• atomic force microscope
• water film
• surface potential
• Kelvin force mode; KFM

詳細情報

• CRID: 1390001206491595264
• NII論文ID: 10002548298
• NII書誌ID: AN00187860
• DOI: 10.2320/jinstmet1952.62.12_1183
• ISSN: 18806880
• ISSN: 24337501
• ISSN: 00214876
• NDL書誌ID: 972833
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I972833
• Web Site: https://www.jstage.jst.go.jp/article/jinstmet1952/62/12/62_12_1183/_pdf
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可