Local structure an lysis of light elements by the extended X-ray emission fine structure (EXEFS) using anaelectron probe micro analyzer (EPMA)

• KAWAI Jun

  Department of Materials Science and Engineering, Kyoto University

• 林 好一

  Department of Materials Science and Engineering, Kyoto University

• 高橋 秀之

  日本電子(株)

Bibliographic Information

Other Title

• EPMAを用いた発光X線微細構造(EXEFS)による軽元素の局所構造分析

Journal

• 材料とプロセス : 日本鉄鋼協会講演論文集 = Current advances in materials and processes : report of the ISIJ meeting

  材料とプロセス : 日本鉄鋼協会講演論文集 = Current advances in materials and processes : report of the ISIJ meeting 11 (3), 625-, 1998-03-05

Details

• CRID: 1571980074003082880
• NII Article ID: 10002552361
• NII Book ID: AN10056461
• ISSN: 09146628
• Text Lang: ja
• Data Source:
  • CiNii Articles