Analysis of the Relationship between the Potential Overshoot under Constant Current Load and the Leakage Current under Constant Potential Load during Aluminum Anodic Oxide Formation

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  • TACHIBANA Kazuhiro
    Department of Materials Science and Engineering, Yamagata University
  • NISHINA Tatsuo
    Department of Materials Science and Engineering, Yamagata University
  • MATSUKI Kenzo
    Department of Materials Science and Engineering, Yamagata University

Bibliographic Information

Other Title
  • アルミニウム陽極酸化における定電圧印加時のリーク電流と定電流印加時の電位オーバーシュートの関係
  • アルミニウム ヨウキョク サンカ ニ オケル テイデンアツ インカジ ノ リーク デンリュウ ト テイデンリュウ インカジ ノ デンイ オーバーシュート ノ カンケイ

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Abstract

<p>It is well known that the leakage current decreases at a constant anodizing potential during the anodic oxide formation on aluminum. To elucidate this phenomenon, chronopotentiometric responses to short current pulses during anodic oxidation at a constant potential have been measured and analyzed. We found that the breakdown voltage of the anodic oxide film changed together with the increment of the potential overshoot during the chronopotentiometric responses to the short current pulse during anodic oxidation at a constant potential. The insulating breakdown voltage increment indicated that it is possible to distinguish between the anodizing potential and the insulating breakdown voltage which is in good agreement with the high electric field mechanism for anodic oxide film formation. The dependence of the potential overshoot of the anodizing current has been analyzed by applying programmed current chronopotentiometry, and we found that the potential overshoot may be closely related to the defects in the anodic oxide film.</p>

Journal

  • Electrochemistry

    Electrochemistry 67 (7), 774-779, 1999-07-05

    The Electrochemical Society of Japan

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