Frontiers in Crystallography with Synchrotron Radiation. X-ray Studies near Absorption Edges of Elements. Atom-Selective Experiments. Study of Local Structure by DAFS.

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  • MIZUKI Jun'ichiro
    Department of Synchrotron Radiation Facilities Project, Kansai Research Establishment

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  • 放射光Ｘ線結晶学で今何ができるか？　吸収端近傍のＸ線を使って　特定の元素に着目して　局所構造をＤＡＦＳで捉える
  • キョクショ コウゾウ オ DAFS デ トラエル

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Abstract

We will describe a rather new X-ray structural technique, Diffraction Anomalous Fine Structure (DAFS), in which the Bragg diffraction intensities of a fixed momentum transfer is measured as a function of the incident X-ray energy. This technique can provide the same short-range structural information as XAFS.<BR>Because DAFS combines the capabilities of diffraction and XAFS into a single technique, it has two enhanced sensitivities compared to the separate technique. These are “spatial selectivity” and “ site selectivity”. In this chapter semiconductor interface structure study as an example for spatial selectivity and structural study of high Tc superconductor as an example for site selectivity will be shown.

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