放射光Ｘ線結晶学で今何ができるか？　吸収端近傍のＸ線を使って　特定の元素に着目して　局所構造をＤＡＦＳで捉える

• 水木 純一郎

  日本原子力研究所大型放射光開発利用研究部

書誌事項

タイトル別名

• Frontiers in Crystallography with Synchrotron Radiation. X-ray Studies near Absorption Edges of Elements. Atom-Selective Experiments. Study of Local Structure by DAFS.
• キョクショ コウゾウ オ DAFS デ トラエル

抄録

We will describe a rather new X-ray structural technique, Diffraction Anomalous Fine Structure (DAFS), in which the Bragg diffraction intensities of a fixed momentum transfer is measured as a function of the incident X-ray energy. This technique can provide the same short-range structural information as XAFS.<BR>Because DAFS combines the capabilities of diffraction and XAFS into a single technique, it has two enhanced sensitivities compared to the separate technique. These are “spatial selectivity” and “ site selectivity”. In this chapter semiconductor interface structure study as an example for spatial selectivity and structural study of high Tc superconductor as an example for site selectivity will be shown.

収録刊行物

• 日本結晶学会誌

  日本結晶学会誌 39 (1), 31-36, 1997

  日本結晶学会

詳細情報

• CRID: 1390282679064451584
• NII論文ID: 10002589080
• NII書誌ID: AN00188364
• DOI: 10.5940/jcrsj.39.31
• ISSN: 18845576
• ISSN: 03694585
• NDL書誌ID: 4159563
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4159563
• 本文言語コード: ja
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可