3. 微少量・高精度・極限に迫る 表面構造をX線回折で調べる X-Ray Diffraction Study on Crystal Surfaces
The structure of crystal surfaces is studied by X-Ray diffraction. The Si (111) √3×√3-Bi structure was analyzed in terms of reflectivity, and the coverage-dependent structures were unambiguously distinguished. The structure of the dimer in Si (001) 2×1 was determined.
日本結晶学会誌 39(1), 94-98, 1997-02-28
The Crystallographic Society of Japan