3. 微少量・高精度・極限に迫る GaAs単結晶の格子間隔の高精度測定 [in Japanese] High Precision Lattice Spacing Measurement of GaAs Single Crystals [in Japanese]
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Characterization by high precision lattice spacing measurement using synchrotron radiation is reviewed, Relationship between lattice spaciing and residual strain, dislocation density, composition of raw material and cell structures are given.
X-RAYS 39(1), 99-104, 1997-02-28
The Crystallographic Society of Japan