これから電子顕微鏡を始める人へ(7) 高分解能電子顕微鏡法とシミュレーション (ディジタルデータに挑戦しよう) [in Japanese] High-Resolution Electron Microscopy and Simulation [in Japanese]
Access this Article
Search this Article
First, constitution of a simulation program for high-resolution electron microscopy is outlined. In order to record high-resolution images accurately, (S/N) and DQE (detective quantum efficiency) characteristics for new recording materials like the imaging plate are presented. It is shown that digital data of high-resolution microscope images appropriately recorded on the imaging plate can quantitatively be analyzed through image simulation with a residual index. Finally, quantitative high-resolution microscopy with a residual index is briefly discussed by comparing with the X-ray and neutron diffraction analysis with the so-called R-factor.
X-RAYS 40(2), 153-160, 1998-04-28
The Crystallographic Society of Japan