これから電子顕微鏡を始める人へ（７）　　高分解能電子顕微鏡法とシミュレーション（ディジタルデータに挑戦しよう）

• 進藤 大輔

  東北大学素材工学研究所

書誌事項

タイトル別名

• An Introduction to the Crystallographre's World. High-Resolution Electron Microscopy and Simulation.
• コレカラ デンシ ケンビキョウ オ ハジメル ヒト エ 7 コウブンカイノウ

抄録

First, constitution of a simulation program for high-resolution electron microscopy is outlined. In order to record high-resolution images accurately, (S/N) and DQE (detective quantum efficiency) characteristics for new recording materials like the imaging plate are presented. It is shown that digital data of high-resolution microscope images appropriately recorded on the imaging plate can quantitatively be analyzed through image simulation with a residual index. Finally, quantitative high-resolution microscopy with a residual index is briefly discussed by comparing with the X-ray and neutron diffraction analysis with the so-called R-factor.

収録刊行物

• 日本結晶学会誌

  日本結晶学会誌 40 (2), 153-160, 1998

  日本結晶学会

詳細情報

• CRID: 1390282679063773440
• NII論文ID: 10002590595
• NII書誌ID: AN00188364
• DOI: 10.5940/jcrsj.40.153
• ISSN: 18845576
• ISSN: 03694585
• NDL書誌ID: 4469100
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4469100
• 本文言語コード: ja
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可