Study on Dielectric Anisotropies in Crystals by Using the Energy-Tunable X-Ray Polarimeter with a Phase Retarder.

DOI Web Site 25 References
  • OKITSU Kouhei
    Engineering Research Institute, School of Engineering, The University of Tokyo
  • UEJI Yoshinori
    Dept. of Synchrotron Radiation Science, School of Mathematical and Physical Science, The Grad Univ. Advanced Studies
  • OGUCHI Takuyo
    (株) スプリングエイトサービス業務部
  • MARUYAMA Hiroshi
    Department of Physics, Faculty of Science, Okayama University
  • HASEGAWA Yuji
    Department of Applied Physics, School of Engineering, The University of Tokyo
  • AMEMIYA Yoshiyuki
    Department of Applied Physics, School of Engineering, The University of Tokyo

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Other Title
  • 移相子付き波長可変Ｘ線ポラリメーターによる結晶の誘電率異方性の研究
  • イソウシ ツキ ハチョウ カヘン Xセン ポラリメーター ニ ヨル ケッショウ

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Abstract

A new type of energy-tunable X-ray polarimeter has been developed by introducing a Hirano-Ishikawa-Kikuta's transmission-type X-ray phase retarder into an X-ray polarimeter consisting of Hart-Rodrigues' polarizer and analyzer. By using the new type of polarimeter, simultaneous detections of X-ray linear birefringence and dichroism, and simultaneous detections of X-ray linear triple refraction and trichroism, have been made for the first time. The Kramers-Kronig relation has been confirmed in the absolute scale of dielectric constant between linear birefringence and dichroism (and between linear triple refraction and trichroism), which correspond to the real and imaginary parts of dielectric anisotropy, respectively. Phase shift due to the birefringence (or the triple refraction) has been measured with a precision of 2π 110, 000, which is limited mainly by photon-counting statistics.

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