Coverage Dependent Structure of Electrochemically Deposited Cu on <i>p</i>-GaAs(100) in H2SO4 Solution Determined by <i>In Situ</i> Surface X-Ray Absorption Fine Structure Spectra
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- Toshihiro Kondo
- Physical Chemistry Laboratory, Division of Chemistry, Graduate School of Science, Hokkaido UniversitySapporo
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- Kazuhisa Tamura
- Physical Chemistry Laboratory, Division of Chemistry, Graduate School of Science, Hokkaido UniversitySapporo
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- Michio Koinuma
- Physical Chemistry Laboratory, Division of Chemistry, Graduate School of Science, Hokkaido UniversitySapporo
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- Hiroyuki Oyanagi
- Electrotechnical LaboratoryTsukuba, Ibaraki
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- Kohei Uosaki
- Physical Chemistry Laboratory, Division of Chemistry, Graduate School of Science, Hokkaido UniversitySapporo
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Abstract
<jats:title>Abstract</jats:title> <jats:p>In situ surface X-ray absorption fine structure technique was applied to study the structures of electrochemically deposited Cu on a p-GaAs(100) electrode with various coverage. Extended X-ray absorption fine structure (EXAFS) spectra of Cu were obtained with high S/N ratio even from submonolayer deposit. EXAFS data showed that the Cu clusters were formed on the p-GaAs(100) electrode as the deposition exceeded more than one monolayer. The structure of the submonolayer deposit was different from that of the bulk deposit. The neighboring atoms in the latter are only Cu of the fcc structure but those in the former are O and Cu of shorter bond length.</jats:p>
Journal
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- Chemistry Letters
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Chemistry Letters 26 (8), 761-762, 1997-08-01
Oxford University Press (OUP)
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Keywords
Details 詳細情報について
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- CRID
- 1360565169062816640
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- NII Article ID
- 10002613840
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- NII Book ID
- AA00603318
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- ISSN
- 13480715
- 03667022
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- Data Source
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- Crossref
- CiNii Articles