Non-Destruction Inspection Technology by a Micro-Focus X-ray System

• FUKAMACHI Tetsuaki

  Advanced Electronics Engineering Dept., Hitachi Denshi Ltd.

Bibliographic Information

Other Title

• マイクロフォーカスX線による内部検査技術

Journal

• 回路実装学会誌

  回路実装学会誌 11 (3), 181-188, 1996-05-20

Details

• CRID: 1574231873810364288
• NII Article ID: 10002644866
• NII Book ID: AN10564349
• ISSN: 13410571
• Text Lang: ja
• Data Source:
  • CiNii Articles