A study of the reverse erase edge noise

• KORENARI T.

  Functional Devices Research Laboratories, NEC Corporation

• TSUBOI S.

  Functional Devices Research Laboratories, NEC Corporation

• OKUMURA T.

  Functional Devices Research Laboratories, NEC Corporation

• MATSUTERA H.

  Functional Devices Research Laboratories, NEC Corporation

• TAGAMI K.

  Functional Devices Research Laboratories, NEC Corporation

Bibliographic Information

Other Title

• リバースイレーズエッジノイズの検討

Journal

• 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan

  日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan 19 142-, 1995-09-01

Details

• CRID: 1573950398833685248
• NII Article ID: 10002646277
• NII Book ID: AN10269644
• Text Lang: ja
• Data Source:
  • CiNii Articles