逐次棄却法PIV解析の精度向上に関する検討 Study on Sub-Pixel PIV Using Successive Abandonment Method
In order to improve the measurement accuracy of the successive abandonment method, three sub-pixel analysis methods are examined about their precision and analysis time. Among them, the weighted average method has the lowest precision. And two others, a reflection point method and a shifted template method, have similar precision. Measurement precision is examined by rotating and shifting a solid pattern. As for analysis time, so far, the former method seems to be faster than the latter.
- 可視化情報学会誌 = Journal of the Visualization Society of Japan
可視化情報学会誌 = Journal of the Visualization Society of Japan 18, 63-66, 1998-07-01
The Visualization Society of Japan