Time Resolved Diffraction Measurements with an Imaging Plate at High Pressure and Temperature

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著者

    • Chen J. CHEN J.
    • Center for High Pressure Research and Department of Geosciences, State University of New York at Stony Brook
    • LI R.
    • Center for High Pressure Research and Department of Geosciences, State University of New York at Stony Brook
    • PARISE J. B.
    • Center for High Pressure Research and Department of Geosciences, State University of New York at Stony Brook
    • KOLEDA C. C.
    • Center for High Pressure Research and Department of Geosciences, State University of New York at Stony Brook
    • BALDWIN K. J.
    • Center for High Pressure Research and Department of Geosciences, State University of New York at Stony Brook

抄録

New developments of the imaging plate diffraction system at beamline X17B1 of the NSLS at Brookhaven National Laboratory for high pressure studies are reported here. Time resolved diffraction patterns can be recorded on an imaging plate by translating the plate in this system. This system was used to observe the olivine-spinel phase transformation in fayalite. The result demonstrates that the phase transformation relaxes stress stored in the sample. Some diffraction peaks of spinel phase, e. g. (400) and (440), were observed to appear prior to the others.

収録刊行物

  • 高圧力の科学と技術 = The Review of high pressure science and technology  

    高圧力の科学と技術 = The Review of high pressure science and technology 7, 272-274, 1998 

    The Japan Society of High Pressure Science and Technology

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各種コード

  • NII論文ID(NAID)
    10002689735
  • NII書誌ID(NCID)
    AN10452913
  • 本文言語コード
    ENG
  • 資料種別
    ART
  • ISSN
    0917639X
  • NDL 記事登録ID
    4493900
  • NDL 雑誌分類
    ZP1(科学技術--化学・化学工業)
  • NDL 請求記号
    Z17-1589
  • データ提供元
    CJP書誌  NDL  J-STAGE 
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